发明名称 SUPPORTING MOUNT FOR AN INSTRUMENT STAND
摘要 A stand for a precision instrument such as a microscope is provided with a pair of vertically extending plane surfaces which are inclined to each other. The mounting block of the instrument is provided with correspondingly shaped plane surfaces so that both pairs of plane surfaces may be superposed upon each other. The mounting block is provided with locking means in the form of a rotatable locking bar which passes through the vertical slot between the plane surfaces on the stand and engages a surface of the stand facing away from the mounting block upon rotation of the locking means through an angle of about 90 DEG . The locking member is also capable of axial movement either concurrent with its rotary movement or independently therefrom.
申请公布号 US3712569(A) 申请公布日期 1973.01.23
申请号 USD3712569 申请日期 1969.11.26
申请人 FA WILL W KG,DT 发明人 DIETRICH T,DT
分类号 F16B1/00;G02B21/24;G02B21/34;(IPC1-7):F16M11/04 主分类号 F16B1/00
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