发明名称 Semiconductor light emitting device, nitride semiconductor wafer, and method for manufacturing nitride semiconductor layer
摘要 According to one embodiment, a semiconductor light emitting device includes: first and second semiconductor layers, a light emitting part, and an In-containing layer. The first semiconductor layer is formed on a silicon substrate via a foundation layer. The light emitting part is provided on the first semiconductor layer, and includes barrier layers and a well layer provided between the barrier layers including Ga1-z1Inz1N (0<z1≦1). The second semiconductor layer is provided on the light emitting part. The In-containing layer is provided at at least one of first and second positions. The first position is between the first semiconductor layer and the light emitting part. The second position is between the second semiconductor layer and the light emitting part. The In-containing layer includes In with a composition ratio different from the In composition ratio z1 and has a thickness 10 nm to 1000 nm.
申请公布号 US9478706(B2) 申请公布日期 2016.10.25
申请号 US201414326065 申请日期 2014.07.08
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Hwang Jongil;Shioda Tomonari;Hung Hung;Sugiyama Naoharu;Nunoue Shinya
分类号 H01L21/00;H01L33/32;H01L33/06;H01L33/00;H01L33/08 主分类号 H01L21/00
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A semiconductor device comprising: a foundation layer; and a first semiconductor layer of a first conductivity type, the first semiconductor layer being provided on the foundation layer and including a nitride semiconductor, wherein the foundation layer includes a multilayered buffer layer provided on a silicon substrate, the multilayered buffer layer includes a plurality of GaN layers and a plurality of AlN layers, the plurality of GaN layers and the plurality of AlN layers being alternately stacked, each of the plurality of AlN layers has an uneven part provided on an upper face thereof, and at least a part of at least one of the plurality of AlN layers has a dotted configuration through an entire thickness of the at least one of the plurality of AlN layers.
地址 Tokyo JP