发明名称 |
ALPHA-RAY OBSERVATION DEVICE AND ALPHA-RAY OBSERVATION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an alpha-ray observation device capable of correctly observing alpha-ray even in an environment where the brightness distribution in a measurement range varies.SOLUTION: An alpha-ray observation device 20 includes: a camera 2 for measuring visible light in an observation area 13; a light condensation section 1 for condensing light including light generated by alpha-rays existing in the range of not greater than the angular field 14a of the camera 2; a wavelength selection section 3 for selecting light of a wavelength originating from the alpha-rays from among the light condensed by the light condensation section 1; a two-dimensional optical detector 5 for detecting a distribution of quantity of the light transmitted through the wavelength selection section 3; and a light quantity distribution correction calculation section 6 for correcting data on the light quantity distribution detected by the two-dimensional optical detector 5 with a correction coefficient calculated from brightness information on the visible light measured in advance by the camera 2 and calculating a distribution of quantity of the light of the wavelength originating from the alpha-rays.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016186440(A) |
申请公布日期 |
2016.10.27 |
申请号 |
JP20150066307 |
申请日期 |
2015.03.27 |
申请人 |
TOSHIBA CORP |
发明人 |
KUME NAOTO;KURODA HIDEHIKO;YOSHIMURA YUKIO |
分类号 |
G01T1/17;G01T1/16 |
主分类号 |
G01T1/17 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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