发明名称 Semiconductor component prodn - with automatic precision mask location esp for fets
摘要 <p>An insulating film of SiO or SiO2 is deposited on a Si substrate in the normal way and windows etched in it for the source and sink electrodes to be deposited on the exposed areas of the substrate, the windows having parallel adjacent edges. The contacts are then electroplated until there is an accurately controlled spread of metal over the edges of the windows. This defines the width of an exposed area of isthmus onto which the gate electrode finger is deposited, the distances from this third electrode to the source and sink regions thus being accurately defined.</p>
申请公布号 FR2149384(A1) 申请公布日期 1973.03.30
申请号 FR19720028653 申请日期 1972.08.03
申请人 IBM 发明人
分类号 H01L29/80;H01L21/033;H01L21/338;H01L23/485;H01L27/00;H01L29/00;H01L29/812;(IPC1-7):01L7/00;01L11/00 主分类号 H01L29/80
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