Dynamic power supply test system

摘要

A test system is connected to power supply means in a data processing system to detect and locate faults which occur due to power supply loading conditions. The data processing system has several functional units, each of which is powered by separate power supply means. The test system which is connected to and monitors the output of each of the power supply means includes filtering means for separating high frequency components from low frequency components, positive and negative polarity level detection means for the high frequency components and for the low frequency components and direct current positive and negative threshold detectors. When the system is in the power test mode, the outputs from the level and threshold detectors are gated to voltage status registers which are periodically interrogated by the data processing system to determine if a fault has occurred due to power supply loading conditions.