发明名称 |
ON-CENTER ELECTRICALLY CONDUCTIVE PINS FOR INTEGRATED TESTING |
摘要 |
A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a. In an alternate embodiment, the lower section includes a leg extension 320 and a sliding contact land 360 which slides against an aperture in the housing. A spacer 342 provides space for decoupling components on the load board. The hinge may include a truncated cylinder 40b which is configured to permit remove of the upper pin without removal of the lower. |
申请公布号 |
HK1216566(A1) |
申请公布日期 |
2016.11.18 |
申请号 |
HK20160104535 |
申请日期 |
2016.04.20 |
申请人 |
JOHNSTECH INTERNATIONAL CORPORATION |
发明人 |
David, JOHNSON;John C., NELSON C;Sarosh, PATEL;Michael, ANDRES |
分类号 |
H01R |
主分类号 |
H01R |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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