发明名称 Method and apparatus for interferometric deformation analysis
摘要 To obtain a photographic record of an object surface having superimposed interference fringes arrayed as a function of the deformation which results in the object from an applied stress, which may be mechanical, thermal, or the like, the object is first illuminated with coherent light. The illuminated surface is then photographed with a camera having an optical wedge disposed over half of its lens to record two slightly displaced overlapping images of the object on the camera film. The object is then stressed by changing the ambient temperature or pressure or other mechanical loading, and the undeveloped film is exposed to a second set of overlapping images. The developed photograph contains a set of equal amplitude fringes representing the interference pattern between the two fringe sets generated by the two exposures and arrayed as a function of the strain in the object as a result of the stress. To render the fringe set visible, an image of the object is projected on a screen through a Fourier, fringe-frequency sensitive filter which enhances the fringe contrast on the resulting image of the object.
申请公布号 US4139302(A) 申请公布日期 1979.02.13
申请号 US19770769422 申请日期 1977.02.17
申请人 DR. RALPH M. GRANT ENGINEERING CONSULTANTS, INC. 发明人 HUNG, YAU Y.;GRANT, RALPH M.
分类号 G01B11/16;G01B11/24;(IPC1-7):G01B11/16;G01B9/02;G01B11/00 主分类号 G01B11/16
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