| 摘要 |
A inker network for use with a tester and a probing machine for marking semiconductor wafers and including a delay circuit for receiving clocking pulses and a first ink command pulse from the tester and for generating a delayed ink command pulse which is delayed an integer number of clock pulses, a direction detector for receiving first and second transport signals from the probing machine and for generating first and second direction signals dependent on the direction the wafer is being transported, and a steering circuit responsive to the delayed pulse in one mode and for generating a double pulse of adjustment width and amplitude on first or second output lines in response to the first and second direction signals, respectively, and in a second mode for generating the double pulse of adjustment width and amplitude on the first or second or both of the output lines in response to the first or second ink command pulse from the tester or both pulses simultaneously, respectively.
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