TESTING DEVICE OF INTEGRATED CIRCUITS,申请号JP19770144729-传众专利搜索

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发明名称	TESTING DEVICE OF INTEGRATED CIRCUITS
摘要
申请公布号	JPS5477575(A)	申请公布日期	1979.06.21
申请号	JP19770144729	申请日期	1977.12.02
申请人	FUJITSU LTD	发明人	HOSHI TOSHIHIRO
分类号	G01R29/26;G01R31/26;G01R31/28	主分类号	G01R29/26
代理机构		代理人
主权项
地址

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