THICKNESS MEASURING METHOD AND APPARATUS,申请号JP19780017768-传众专利搜索

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法人/股东/高管

发明名称	THICKNESS MEASURING METHOD AND APPARATUS
摘要
申请公布号	JPS54110867(A)	申请公布日期	1979.08.30
申请号	JP19780017768	申请日期	1978.02.17
申请人	KUME HIROYOSHI	发明人	KUME HIROYOSHI
分类号	G01B7/06	主分类号	G01B7/06
代理机构		代理人
主权项
地址

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