| 摘要 |
A method and device for measuring a profile of a plate. The device for measuring a profile of a plate includes a plurality of aligned waveshape detectors for detecting a plurality of waveshapes and generating a plurality of waveshape signals, a waveshape processing means for determining signal variation values from the waveshape signals within small periods of time and for summing the signal variation values over a predetermined period of time and subtracting means for comparing the summed signal variation values and for generating outputs corresponding to distortion in the profile of the plate. The method for measuring a profile of a plate includes the steps of detecting the plurality of waveshapes at a plurality of positions aligned with each other in a widthwise direction of the plate, determining signal variation values in the detective waveshapes within short periods of time, summing the signal variation values over a predetermined time and comparing the summed signal variation values with one another whereby distortion of the profile of the plate is measured.
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