发明名称 SEMICONDUCTOR DEVICE
摘要 <p>A field effect transistor (35) and a gate protecting diode (36) are formed on the same substrate. The breakdown voltage of the diode is set to be lower than that of the gate by increasing the thickness of diode region (34b) and/or increasing the concentration of impurities.</p>
申请公布号 WO1982002799(P1) 申请公布日期 1982.08.19
申请号 JP1982000033 申请日期 1982.02.04
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址