发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form an insulation and isolation without crack nor bird beak by repeatedly performing the accumulation of polysilicon and the oxidation thereof on V-shaped grooves formed on a substrate, forming the oxidized film of thick polysilicon and then flattening the film. CONSTITUTION:Polysilicon 4 of 2,000Angstrom is accumulated on a substrate formed with V-shaped grooves, and oxidation is performed in the range of polysilicon thus accumulated. After the polysilicon 7 is further accumulated in a thickness of 4,000Angstrom , it is oxidized. Polysilicon 9 of 8,000Angstrom is accumulated at the third time, and the similar oxidation is performed. The oxidized film of thick polysilicon thus accumulated is flattened by ion milling, and a nitrided film is removed. In this manner, insulation and isolation without bird beak is performed.
申请公布号 JPS57162347(A) 申请公布日期 1982.10.06
申请号 JP19810047064 申请日期 1981.03.30
申请人 FUJITSU KK 发明人 FUKUYAMA TOSHIHIKO
分类号 H01L21/76;H01L21/31;H01L21/762 主分类号 H01L21/76
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