发明名称 Semiconductor device having improved interlevel conductor insulation
摘要 A semiconductor device and method of manufacture employs an improved insulating layer to laterally separate conductive layers or regions. A relatively thick insulating layer is anisotropically patterned to form an electrode having a thick insulating layer on its side walls. Subsequently defined conductive regions are separated from the electrode by a distance determined by the thickness of the insulating layer. In devices requiring multiple level polycrystalline silicon electrodes, shorts between electrodes are reduced; in MOS devices, operating parameters are improved due to decreased overlap of the gate electrode over the source or drain region, decreased contamination of the gate electrode during manufacture, and more uniform gate oxide definition along the active channel between the source and drain.
申请公布号 US4356040(A) 申请公布日期 1982.10.26
申请号 US19800146938 申请日期 1980.05.02
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 FU, HORNG-SEN;TASCH, JR., AL F.;CHATTERJEE, PALLAB K.
分类号 H01L21/033;H01L21/8242;(IPC1-7):H01L21/70;H01L21/26 主分类号 H01L21/033
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