摘要 |
A structural beam focusing improvement is introduced into the main focusing electrode of at least one of the gun structures in a CRT plural beam bi-potential in-line electron gun assembly. This improvement, being in the form of a pair of sideboard elements, one of which is positioned on either side of a forward aperture in the unitized main focusing electrode, imparts correctional influences to asymmetries in the respective lensing field, thereby resulting in the achievement of a desired circular beam spot landing at the center of the screen.
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