| 摘要 |
<p>A number of contact probes are mounted in a base. Each contact probe has a spring loaded first end located at, and urged away from, a first side of the base and a second end located at a second side of the base. A mounting member, for reciprocal movement relative to the first side of the base, has an opening through it providing access to the first ends of the contact probes and a plate support facing away from the base. A programming plate has mounted in it a number of axially elongated and rigid test pins which are axially movable relative to the programming plate. The total number of test pins is less in number than the contact probes. Each test pin has a first end located on a first side of the programming plate and a second end located on a second side of the programming plate.</p> |
