发明名称 |
Integrated circuit devices comprising dielectric isolation regions and methods for making such devices. |
摘要 |
<p>A method is proposed for manufacturing a semiconductor device, which comprises forming groove(s) (103) having a vertical wall in a semiconductor substrate (101); doping the same type of impurity as that of the substrate (101) at a dose of not less than 1 x 1014 cm-2 or the opposite type of impurity to that of the substrate (101) in said groove(s) (103) to form an impurity region (104); filling the groove(s) (103) with an insulating material to form a field region (106). A semiconductor device having an impurity region (104) of the same conductivity type as that of the semiconductor substrate (101) under a buried field region and of a sheet resistance ps = 50 ohms/D is also proposed.</p> |
申请公布号 |
EP0091984(A2) |
申请公布日期 |
1983.10.26 |
申请号 |
EP19820108596 |
申请日期 |
1982.09.17 |
申请人 |
TOKYO SHIBAURA DENKI KABUSHIKI KAISHA |
发明人 |
IWAI, HIROSHI |
分类号 |
H01L21/74;H01L21/762;H01L29/06;(IPC1-7):01L21/76;01L29/06 |
主分类号 |
H01L21/74 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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