发明名称 Integrated circuit devices comprising dielectric isolation regions and methods for making such devices.
摘要 <p>A method is proposed for manufacturing a semiconductor device, which comprises forming groove(s) (103) having a vertical wall in a semiconductor substrate (101); doping the same type of impurity as that of the substrate (101) at a dose of not less than 1 x 1014 cm-2 or the opposite type of impurity to that of the substrate (101) in said groove(s) (103) to form an impurity region (104); filling the groove(s) (103) with an insulating material to form a field region (106). A semiconductor device having an impurity region (104) of the same conductivity type as that of the semiconductor substrate (101) under a buried field region and of a sheet resistance ps = 50 ohms/D is also proposed.</p>
申请公布号 EP0091984(A2) 申请公布日期 1983.10.26
申请号 EP19820108596 申请日期 1982.09.17
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 IWAI, HIROSHI
分类号 H01L21/74;H01L21/762;H01L29/06;(IPC1-7):01L21/76;01L29/06 主分类号 H01L21/74
代理机构 代理人
主权项
地址