发明名称 Reflected light measuring system
摘要 The invention relates to a reflected light measuring system for machine tools and measuring instruments. In the measuring system, the graduation carrier and the scanning unit are arranged in a hollow body assembled from a profiled support and screening parts which can be attached thereto, the graduation plane of the graduation carrier lying in the neutral fibre of the hollow body. The scanning unit is mounted by means of rollers on the graduation carrier and on the support, and has a magnetic element in its region adjacent to the graduation carrier. The support has a U-shaped or H-shaped profile. The screening parts consist of sheet metal or plastic and on their area averted from the support are provided with sealing lips or are elastically constructed. <IMAGE>
申请公布号 DE3427027(A1) 申请公布日期 1985.04.18
申请号 DE19843427027 申请日期 1984.07.21
申请人 JENOPTIK JENA GMBH 发明人 HENTSCHEL,ULRIKE,DIPL.-ING.
分类号 G01D5/347;(IPC1-7):G01B11/02 主分类号 G01D5/347
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