| 摘要 |
PURPOSE:To uniform the sensitivity in an element to incident X rays by putting a photodetector substantially opposite to the radiation incidence side of a scintillator, increasing the photodetection quantity of fluorescent light at a part distant from the photodetector, and decreasing the photodetection quantity of fluorescent light at a nearby part. CONSTITUTION:An incident radiation beam 2 is transmitted through a light shield plate and reflecting plate 5 to reach a powder scintillator 6 arranged slantingly to the optical axis of the radiation beam 2, and the beam is converted into light. The majority of the reflected light is radiated to the radiation incidence side of the scintillator 6. This light is reflected by a light reflecting film 9 provided on the surfaces of the reflecting plate 5 and a partition plate and photodetected and converted into an electric signal by a semiconductor photodetector 7. The semiconductor detector 7 is elevated to the scintiallator 6 by distance (x) and turned by an angle theta to increase the degree of the confrontation between the scintilator 6 and detector 7, photodetecting the emitted light of the scintilator 6 uniformly.
|
