发明名称 Capacitance-type material level probe and method of manufacture
摘要 A capacitance probe and method of probe manufacture for material level sensing systems and like applications. The probe includes a probe rod, a tubular guard coaxially surrounding the rod intermediate the rod ends, and insulation material formed as an integral piece in an injection molding operation surrounding the rod between the rod and guard and also surrounding and radially overlapping axially spaced ends of the tubular guard. One end of the rod and a portion of the guard intermediate its ends are exposed through the insulation material. The molded assembly is captured within a nipple or the like for mounting to a material vessel such that the exposed surfaces of the rod and guard are disposed internally of the vessel for capacitance coupling to material therewithin.
申请公布号 US4549245(A) 申请公布日期 1985.10.22
申请号 US19840652853 申请日期 1984.09.21
申请人 BERWIND CORPORATION 发明人 FLECKENSTEIN, PHILLIP P.
分类号 G01F23/26;(IPC1-7):H01G5/28;G01R27/26 主分类号 G01F23/26
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