发明名称 Method and apparatus for drying semiconductor wafers
摘要 A semiconductor wafer is held on a first rotating element in a manner having a first portion of one surface of the wafer stuck on the first rotating element. The first rotating element is rotated together with the wafer thus held thereon to remove moisture from surface portions of the wafer other than the first portion. Then, the wafer is held on a second rotating element in a manner having a second portion of the one surface of the wafer stuck on the second rotating element. The second rotating element is rotated together with the wafer thus held thereon to remove moisture from the surfaces of the wafer including at least the first portion thereof, thereby completely drying the wafer.
申请公布号 US4559718(A) 申请公布日期 1985.12.24
申请号 US19840633134 申请日期 1984.07.23
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 TADOKORO, HIDEO
分类号 F26B5/08;(IPC1-7):F26B5/08 主分类号 F26B5/08
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