| 摘要 |
PURPOSE:To obtain a test handler with high productivity by lowering an IC device to be tested by gravitation along a vertical or slanting guide, stopping the device by a stopper provided in the middle, and bringing it into contact with a measuring head. CONSTITUTION:A stop lever 31 which stops the gravitational fall of an ID device with its mold part is provided between upper and lower vertical guides 13 and 22, and 14 and 21 of the contact part 12 of the test handler so that the stop lever moves in and out horizontally. When the stop lever 31 is drawn to left, the IC device falls by gravitation. A contact lever 32 engages slidably the periphery of the right-side end part of a heating lever 30 and the stop lever 31. Further, a contact pin 35 contacts a terminal of the IC device securely with the spring in the contact part 42. The contact layer 32 is drawn out after the IC device is tested to allow the IC device to fall by graviation. At this time, a transmission sensor at the exit side of the IC device is shielded, so the exiting of the IC device protruding from the contact part is detected and the stop lever 31 is held protruding as shown in a figure.
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