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发明名称
SCAN PARTICLE MICROSCOPE
摘要
申请公布号
JPS61208736(A)
申请公布日期
1986.09.17
申请号
JP19860050275
申请日期
1986.03.07
申请人
SIEMENS AG
发明人
YURUGEN FUROOJIEN;RAINAA SHIYUPEERU
分类号
H01J37/145;H01J37/06;H01J37/153;H01J37/28
主分类号
H01J37/145
代理机构
代理人
主权项
地址
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