TESTING METHOD FOR SEMICONDUCTOR DEVICE,申请号JP19850160234-传众专利搜索

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发明名称	TESTING METHOD FOR SEMICONDUCTOR DEVICE
摘要
申请公布号	JPS6222076(A)	申请公布日期	1987.01.30
申请号	JP19850160234	申请日期	1985.07.22
申请人	HITACHI HOKKAI SEMICONDUCTOR LTD;HITACHI LTD	发明人	NISHIMURA KOICHI
分类号	H01L21/66;G01R31/26	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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