摘要 |
An X-ray imaging system and method. The method comprises: an X-ray source (10), emitting an X-ray beam; a first optical grating (80) and a second optical grating (90), sequentially disposed along the emission direction of an X-ray; a detector (20), disposed at a lower part of the second optical grating (90) in the emission direction of the X-ray; and a control and data processing device (60), used for controlling the X-ray source (10) to emit an X-ray, controlling the detector (20) to receive an X-ray passing through the first optical grating (80) and the second optical grating (90), generating phase contrast information and/or dark field information, and performing a CT check on a checked object (40) according to the phase contrast information and/or the dark field information, so as to obtain a CT image. By using the system, more characteristic information about a checked objet can be obtained, thereby making material recognition more accurate and improving security check performance. |
申请人 |
TSINGHUA UNIVERSITY;NUCTECH COMPANY LIMITED |
发明人 |
CHEN, Zhiqiang;ZHANG, Li;SHEN, Le;HUANG, Qingping;JIN, Xin |