发明名称 Piezoelectric material testing method and apparatus
摘要 An arrangement for testing substrate material intended for use in surface acoustic wave devices such as delay lines; the arrangement includes a plurality of electrical and physical evaluations of the material in quantities suitable for a manufacturing environment. In one evaluation acoustic wave energy developed in a tooling jig mounted transducer is mechanically coupled to successive material samples and the resulting output waveforms compared to expected results while in other evaluations the polarized light indicia and chemical reagent determined properties of the material samples are considered.
申请公布号 US4668909(A) 申请公布日期 1987.05.26
申请号 US19840607089 申请日期 1984.05.04
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE 发明人 HICKERNELL, FREDERICK S.;ADAMO, MICHAEL D.;CHO, FREDERICK Y. T.
分类号 G01R29/22;(IPC1-7):G01R29/22 主分类号 G01R29/22
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