发明名称 APPARATUS FOR MEASURING TEMPERATURE CHARACTERISTIC
摘要 PURPOSE:To make it possible to accurately measure a temp. characteristic within a short time, by simple equipment constituted so that electronic parts to be measured and standard electronic parts of which the temp. characteristic is known are mounted in a casing to provide a predetermined temp. condition. CONSTITUTION:An elastic surface wave device 12a being a standard product of which the temp. characteristic of resonance frequency is known and an elastic surface wave device 12b to be measured 12b are mounted to the sockets 13a, 13b of a base stand 11a and a lid body 11b is mounted to the base stand 11a. A cooling agent is sealed in the space of the base stand 11a and the lid body 11b from a blowing part 15 at a cooling time and hot air is sealed therein at a heating time by a dryer to adjust measuring temp. The resonance frequency of the elastic surface wave device 12a is measured by a frequency-measuring device 25 to measure temp. and, when predetermined temp. is obtained, the electrical characteristic value of the device 12b is measured at the predetermined temp. analyzed by a network analyser 21 by a phase amplitude display device 22.
申请公布号 JPS62126358(A) 申请公布日期 1987.06.08
申请号 JP19850266342 申请日期 1985.11.27
申请人 TOSHIBA CORP 发明人 MATSUSHITA TOSHIKAZU
分类号 G01R31/00 主分类号 G01R31/00
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