| 摘要 |
PURPOSE:To make it possible to quantitatively judge the deterioration state of electronic parts, by comparing the temp. image data obtained from an image data correction apparatus with threshold value image data selected from a reference image for judging deterioration preliminarily recorded in a memory. CONSTITUTION:When deterioration coefficient theta changes, a straight line (a) showing the relation between DELTAT and W changes in its inclination a shown by a dotted line (b). A deterioration judging temp. image (reference image) is formed using a computer to be preliminarily recorded in a memory and compared with the temp. image data due to a change with the elapse of time on an electronic circuit board to diagnose the deterioration of the parts on the board. The image data of temp. change distribu tion due to this change with the elapse of time is obtained by taking the difference with past measured data. Fur example, if t1-t3 are set as isotherms (t1<t2<t3) showing temp. difference image data, the following comparision with the aforementioned refer ence image is performed. In the case (1) of a resistor, processings like T1>t2... normal state, and T1<t2... deteriorated state, is performed and, in the case (2) of a transistor, processing like T2>t3... normal state, and T2<t3... deteriorated state, is performed to diagnose the deterioration of parts on the board.
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