发明名称 PROBE FOR HIGH TEMPERATURE
摘要 PURPOSE:To obtain a probe generating no peeling between a vibrator and a case, even in case a differential thermal expansion of the vibrator and the case is large, by providing a slit in advance in the vibrator. CONSTITUTION:A probe is formed by enclosing a vibrator 3 provided with a slit 6, into a closed container consisting of a case 1 and an upper cover 2, and when transmitting and receiving an ultrasonic wave, a high temperature use cable 7 is used. The vibrator 3 and the case 1 are joined by a high temperature use adhesive layer 5. At the time of transmission, an electric signal is applied between an electrode 4 and the case 1, a distortion is generated in the vibrator 1, and this distortion goes to a pressure wave and propagated to the outside from the bottom face of the case 1. At the time of reception, a signal by the distortion of the vibrator 1 is obtained as an electric signal between the electrode 4 and the case 1. Since the slit 6 is provided in the disk- shaped vibrator 3, even if a stress caused by a differential thermal expansion is applied to the vibrator 3 and the case 1, the slit 6 progresses in the thickness direction or penetrates to the upper part and releases the stress, before a junction layer 5 peels off.
申请公布号 JPS62145163(A) 申请公布日期 1987.06.29
申请号 JP19850285598 申请日期 1985.12.20
申请人 HITACHI LTD 发明人 YAMADA IZUMI
分类号 G01B17/02;G01N29/04;G01N29/24 主分类号 G01B17/02
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