发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To facilitate forming an emitter region and a base contact region with a distance shorter than the lower limit distance of the conventional constitution by a method wherein an emitter window is formed in a silicon oxide film and a polycrystalline silicon film containing arsenic is formed by evaporation and a region of the polycrystalline silicon film which is a little wider than the emitter window is left and a base contact region is formed outside the remaining region. CONSTITUTION:A base region 9 is formed in a semiconductor substrate 8. A silicon oxide film 10 is formed by evaporation on the surface and an emitter window 11 is formed. Then a polycrystalline silicon film 12 containing arsenic is formed by evaporation and resist 13 is applied to the surface. Photolithography process is applied to the resist 13 so as to leave a region of the polycrystalline silicon film 12 which is a little wider than the window 11 and then the polycrystalline silicon film 12 is etched. Then the silicon oxide film 10 is removed and a base contact region 15 is selectively formed on the semiconductor substrate 8 outside the remaining region of the polycrystalline silicon film. After that, metal is evaporated to form electrodes and an emitter electrode 16 and a base electrode 17 are formed by utilizing the difference in levels of the part where the polycrystalline silicon film 12 remains and the part where it does not.
申请公布号 JPS62224968(A) 申请公布日期 1987.10.02
申请号 JP19860069030 申请日期 1986.03.27
申请人 MATSUSHITA ELECTRONICS CORP 发明人 YAMANISHI YUJI
分类号 H01L29/73;H01L21/331;H01L29/72;H01L29/732 主分类号 H01L29/73
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