发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To facilitate forming an emitter region and a base contact region with a distance shorter than the lower limit distance of the conventional constitution by a method wherein an emitter window is formed in a silicon oxide film and a polycrystalline silicon film containing arsenic is formed by evaporation and a region of the polycrystalline silicon film which is a little wider than the emitter window is left and a base contact region is formed outside the remaining region. CONSTITUTION:A base region 9 is formed in a semiconductor substrate 8. A silicon oxide film 10 is formed by evaporation on the surface and an emitter window 11 is formed. Then a polycrystalline silicon film 12 containing arsenic is formed by evaporation and resist 13 is applied to the surface. Photolithography process is applied to the resist 13 so as to leave a region of the polycrystalline silicon film 12 which is a little wider than the window 11 and then the polycrystalline silicon film 12 is etched. Then the silicon oxide film 10 is removed and a base contact region 15 is selectively formed on the semiconductor substrate 8 outside the remaining region of the polycrystalline silicon film. After that, metal is evaporated to form electrodes and an emitter electrode 16 and a base electrode 17 are formed by utilizing the difference in levels of the part where the polycrystalline silicon film 12 remains and the part where it does not.
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申请公布号 |
JPS62224968(A) |
申请公布日期 |
1987.10.02 |
申请号 |
JP19860069030 |
申请日期 |
1986.03.27 |
申请人 |
MATSUSHITA ELECTRONICS CORP |
发明人 |
YAMANISHI YUJI |
分类号 |
H01L29/73;H01L21/331;H01L29/72;H01L29/732 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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