发明名称 DETECTING CIRCUIT FOR ABNORMALITY OF ELECTRIC EQUIPMENT
摘要 PURPOSE:To easily standardize an electronic equipment and at the same time to facilitate the pursuit and countermeasure of causes of abnormality, by providing a power supply in addition to a processor power supply and decentralizing abnormality processing modules. CONSTITUTION:An abnormal signal received from an abnormality detector 1 in a processor 5 is connected to an abnormality processing module 7. The module 7 contains a memory, a microprocessor for control, etc. and the operation power supply is given from a host device 8 for another device in addition to a processor power supply 6. The module 7 receives the abnormal signal from the detector 1 set the bit corresponding to the detector 1 to its built-in memory and also breaks immediately the power supply 6 according to the contents of the abnormality. Furthermore, the module 7 sends an abnormality occurrence signal to the device 8 and waits for an indication of the device 8. In case the scale of the processor 5 is large, plural modules 7 are decentralized.
申请公布号 JPS62285146(A) 申请公布日期 1987.12.11
申请号 JP19860127877 申请日期 1986.06.04
申请人 HITACHI LTD 发明人 KOZAI HIROSHI;MURANO MASUO
分类号 G06F11/30 主分类号 G06F11/30
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