发明名称 |
Integrated circuit comprising MOS transistors having electrodes of metallic silicide and a method of fabrication of said circuit |
摘要 |
A novel MOS transistor structure comprises electrodes of metallic silicide and especially tantalum silicide. In the case of the gate electrode, the silicide is directly in contact with an insulating thin-film layer. In the case of the drain and source electrodes, the silicide is directly in contact with the monocrystalline silicon. The method of fabrication is thus simplified while avoiding the use of polycrystalline silicon.
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申请公布号 |
US4731318(A) |
申请公布日期 |
1988.03.15 |
申请号 |
US19860831851 |
申请日期 |
1986.02.24 |
申请人 |
SOCIETE POUR L'ETUDE ET LA FABRICATION DES CIRCUITS INTEGRES SPECIAUX - E.F.C.I.S. |
发明人 |
ROCHE, ALAIN;BOREL, JOSEPH |
分类号 |
H01L21/28;H01L21/285;H01L21/336;H01L29/08;H01L29/45;H01L29/49;(IPC1-7):G03C5/00;G03C5/04;H01L21/00;B44C1/22 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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