发明名称 SURFACE DEFECT DETECTOR
摘要 PURPOSE:To improve the uniformity of a current distribution in a measurement area and to monitor the progressive state of a surface defect with high accuracy by forming plural couples of feed terminals so that they can be displaced, and providing a terminal position control part which displaces and positions the terminal couples according to the current distribution inside the terminal couples. CONSTITUTION:The plural feed terminal couples 3 are displaceable and displaced by the terminal position control part 6. When a current is supplied to the terminal couples 3 under the command of a computer 7 through a constant current source 9 and a polarity converting device 8, the current distribution is generated inside. The current distribution is measured through a potential difference measurement terminal 4, a scanner 10, and a voltmeter 11 and inputted to and processed by the computer 7. The terminal couples 3 are moved with a control signal from the control part 6 according to the result to uniform the current distribution in the measurement area. In such a state, signals from terminals 4 are processed by the computer 7 to detect whether or not there is a surface defect and its shape.
申请公布号 JPS63132151(A) 申请公布日期 1988.06.04
申请号 JP19860278163 申请日期 1986.11.21
申请人 HITACHI LTD 发明人 OTAKA MASAHIRO;HAYASHI MAKOTO;TAKAKU KAZUO
分类号 G01N27/20 主分类号 G01N27/20
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