| 摘要 |
PURPOSE:To reduce the cost of a testing device by moving a test head which has test pins arrayed zigzag at intervals equal to an integral multiple of the pitch of a grating point pattern in a row or column direction, pitch by pitch, and taking a test divisionally even times. CONSTITUTION:The test pins 1 are arrayed zigzag on the head base 20a of a test head 2 at intervals twice the pitch of the grating point pattern 4 of a printed board 3. The pattern 4 is brought into contact opposite the pins first and a specific test is conducted. Then a moving means 7 moves the printed board 3 or head 2 relatively in the row or column direction by one pitch and a test is conducted. This test is repeated even times to conduct the test by bringing the head 2 which has a small number of pins into contact with all patterns 4. Therefore, the number of fitting holes for the pins is small, so working accuracy is easy secured and the cost is reduced.
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