| 摘要 |
PURPOSE:To make connection check easy even in the case of extremely many terminal pins, by providing the inside with buffers and logic circuits for connection check, and performing connection check in the manner in which wiring patterns are lumped together to apply HI level or LO level. CONSTITUTION:Inputs of each testing buffer 16 and each output terminal I1-In, O1-On are connected. Outputs of each testing buffer 16 and each input terminal O1-On, I1-In are connected to inputs of logic product circuits. Outputs of the logic product circuits are connected to a test terminal. Wiring patterns connected to a plurality of input terminals I1-In and a plurality of output terminals O1-On are all set as HI level, and whether the test terminal turns on HI level or not is checked. Then these wiring patterns are turned to LO level one by one, and whether the test terminal takes a zero level or not is checked on each occasion. Thereby, connection check can be very easily performed in spite of considerably large number of terminal pins.
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