发明名称 FORMATION OF THIN FILM PATTERN
摘要 PURPOSE:To prevent the occurrence of breaking of the source wiring and the like by forming a thin film on a light transmission substrate containing silicon oxide as a component with an internal stress not larger than a constant tensile stress. CONSTITUTION:A thin film 8 is formed on a light transmission substrate 6 containing silicon oxide as a component so that the product of the internal tensile stress and the thickness becomes 1X10<5>dyn/cm or less, and the thin film 8 is exposed to an etchant containing hydrofluoric acid thereby to form a pattern. Accordingly, the damage to the glass or quartz substrate is controlled. With this, even if the substrate 6 is exposed to an etchant of the hydrofluoric acid system, no hole occurs and no breaking of the wiring to be formed in the substrate occurs.
申请公布号 JPS63261838(A) 申请公布日期 1988.10.28
申请号 JP19870096602 申请日期 1987.04.20
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MIYATA YUTAKA;TSUTSU HIROSHI;KAWAMURA TETSUYA;KARASAWA TAKESHI
分类号 H01L21/205;H01L21/306;H01L21/336;H01L27/12;H01L29/78;H01L29/786 主分类号 H01L21/205
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