发明名称 |
FORMATION OF THIN FILM PATTERN |
摘要 |
PURPOSE:To prevent the occurrence of breaking of the source wiring and the like by forming a thin film on a light transmission substrate containing silicon oxide as a component with an internal stress not larger than a constant tensile stress. CONSTITUTION:A thin film 8 is formed on a light transmission substrate 6 containing silicon oxide as a component so that the product of the internal tensile stress and the thickness becomes 1X10<5>dyn/cm or less, and the thin film 8 is exposed to an etchant containing hydrofluoric acid thereby to form a pattern. Accordingly, the damage to the glass or quartz substrate is controlled. With this, even if the substrate 6 is exposed to an etchant of the hydrofluoric acid system, no hole occurs and no breaking of the wiring to be formed in the substrate occurs.
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申请公布号 |
JPS63261838(A) |
申请公布日期 |
1988.10.28 |
申请号 |
JP19870096602 |
申请日期 |
1987.04.20 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MIYATA YUTAKA;TSUTSU HIROSHI;KAWAMURA TETSUYA;KARASAWA TAKESHI |
分类号 |
H01L21/205;H01L21/306;H01L21/336;H01L27/12;H01L29/78;H01L29/786 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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