| 摘要 |
PURPOSE:To detect the inclination of a workpiece with high accuracy in a short time without requiring skill by relatively moving a pair of micrometers which are adjusted so as to be in parallel to cutting wires in a perpendicular direction to the workpiece and simultaneously measuring the deflection and tilting of its end face. CONSTITUTION:A line connecting the ends of the probes 15a of a pair of electric micrometers is adjusted to be parallel with a plane including the detecting lights of two sets of photoelectric switches 13, the indicators 4 of the micrometers are set to zero, cutting wires 2 are brought close to the micrometers and a supporting plate 11 is adjusted to make the photoelectric switches 13 simultaneously detect the wires 2, and the line connecting the ends of the probes is made parallel to the wires 2. Then, the probes 15a are brought into contact with the end face of a workpiece 1 and, by confirming its deflecting direction by the indicators 4, the angle of deflecting direction of the table 3 is adjusted so as to make the values of two indicators 4 zero. And, by moving the table 3 vertically while keeping the probes 15a in contact with the end face of the workpiece 1, its tilting direction is confirmed through the indicators 4 and the inclination in the tilting direction of the table 3 is adjusted so as to make the values of the two indicators 4 zero. |
