发明名称 MEASURING APPARATUS FOR FINE PARTICLE IN LIQUID
摘要 PURPOSE:To enable the handling of a positional deviation along the depth of a light receiving lens between a laser flux and a mask, by providing a detection element on a laser light optical axis to generate an output varying with a deviation in the optical axis after passage through a particle detection area for monitoring. CONSTITUTION:Laser flux 3 is made incident through an incident window 4 so as to condense on a particle measuring area (condensing point) 3a. Scattered light 14 from fine particles 17 in a liquid passing through a condensing point 3a is received with a light receiving window 5 to form an image on a mask 7 with a light receiving lens 6, converted into an electrical signal with a photoelectric converter 8 and a parti cle size is calculated with a pulse height analyzer 9 from intensity of the scattered light to display 10. The laser flux 3 once condensed is emitted out of a measuring cell 20 through an emission window 11 diverging to be incident into a beam split cube 42 and mostly transmitted through to be absorbed by a light trap 12. The lumi nous flux divided with the cube 42 forms an image on a semiconductor position detecting element 46 with an imaging lens 44. A signal from the element 46 is inputted into a circuit for detecting a deviation in the optical axis and the deviation is displayed with an LED or the like when exceeding an allowable range.
申请公布号 JPS63314443(A) 申请公布日期 1988.12.22
申请号 JP19870150117 申请日期 1987.06.18
申请人 KOWA CO 发明人 KANEBAKO MAKOTO;FUJITA AKIHIRO
分类号 G01N15/14 主分类号 G01N15/14
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