发明名称 IC TESTING SYSTEM
摘要 PURPOSE:To quickly execute an information exchange between a processor and a storage device, and to improve a test speed by storing the information of each separate function in each separate storage device, and controlling independently each other each storage device thereof by each independent address information line. CONSTITUTION:In a storage device 28, a control program for decoding a program given from a host processor 21 and executing it is stored. Also, in a storage device 29, a sequence program for controlling actually a hardware module 25 is stored, and a storage device 30 stores a measured data. To these respective storage devices 28, 29 and 30, a common data input line 32 and a common data output line 33 are connected. Moreover, to phase respective storage devices 28, 29 and 30, each separate address line 34, 35 and 36 is connected from a processor 23, and independent address information can be placed on these address lines 34, 35 and 36 by the processor 23.
申请公布号 JPS63315971(A) 申请公布日期 1988.12.23
申请号 JP19870152898 申请日期 1987.06.19
申请人 ADVANTEST CORP 发明人 UEDA MOTOO;HASEGAWA SHINPEI;SHIMIZU TOSHIYUKI
分类号 G01R31/317;G01R31/28;H01L21/66 主分类号 G01R31/317
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