FAILURE DETECTION RATE CALCULATION DEVICE, FAILURE DETECTION RATE CALCULATION PROGRAM AND METHOD THEREOF, AS WELL AS TEST PATTERN GENERATION APPARATUS, AND TEST PATTERN GENERATION PROGRAM AND METHOD THEREOF

摘要

PROBLEM TO BE SOLVED: To evaluate a failure detection rate considering physical defects and physical failures by a single failure detection rate.SOLUTION: A failure detection rate calculation method is characterized by: calculating a first CA showing an area where a first failure occurs by fine particles for every wiring, by using placement and routing information corresponding to a netlist; calculating a second CA showing an area where a second failure different from the first failure occurs by the fine particles for every wiring, by using the placement and routing information; calculating first failure detection information showing whether the first failure in each of the wiring of the netlist can be detected, and second failure detection information showing whether the second failure in each of the wiring of the netlist can be detected, by a test pattern for verifying an operation of a logic circuit; and calculating a failure detection rate by using a first failure detection value weighting the first fault detection information according to the first CA, a second failure detection value weighting the second fault detection information according to the second CA and a total CA obtained by adding a total sum of the first CA and the total sum of the second CA.SELECTED DRAWING: Figure 18