Three-dimensional shape measuring apparatus

摘要

A three-dimensional shape measuring apparatus includes a projection device having a projecting plane witha grating pattern formed therein and a light source for illuminating, through the projection plane, an object of interest located at an arbitrary position in the same three-dimensional coordinate system as that of the projection device, an observation device located in the same three-dimensional coordinate sysem as that of the object and having an observation plane and a specific point located between the observation plane and the object. In the apparatus, the grating pattern in the projection plane is projected on a surface of the object to form a projected grating pattern thereon when the light source is turned on, the grating pattern projected on the object is observed in the observation plane. The three-dimensional coordinates of an arbitrary sample point on the projected grating line on the object are determined by utilizing the fact that a sample point on the object is an intersection between a light ray emitted from the light source of the projection device and illuminating the sample point on the object and a line including the specific point of the observation device and the sample point in the observation plane, thereby measuring a three-dimensional shape of the object.