发明名称 Inspection device for inspecting projections on the surface of parts
摘要 An inspection device for inspecting projections of a part which can be applied to a variety of parts having projections on the surface thereof such as leads of electronic parts having varying shapes. The inspection device includes a member having a two-dimensional surface to which projections of the part are two-dimensionally pressed at a predetermined pressure, and an arrangement for detecting a pressure distribution pattern on the surface of the member as well as a converter for converting the detected pattern to two-dimensional pattern information. Further, a memory is provided for storing a reference pattern of the projections of the part so that inspection may be effected by comparing the reference pattern with the converted two-dimensional pattern information.
申请公布号 US4803871(A) 申请公布日期 1989.02.14
申请号 US19870048725 申请日期 1987.05.11
申请人 HITACHI, LTD;HITACHI COMPUTER ENGINEERING CO., LTD 发明人 HARADA, OSAMU;KOJIMA, AKIO;IKEDA, SOUHEI;WATANABE, YOSHIHISA;TSUJI, YOSHIHISA
分类号 H05K13/08;(IPC1-7):G01B11/24;G01B5/20;G01B7/16;G01B7/28 主分类号 H05K13/08
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