发明名称 ELEMENTARY PARTICLE CORRELATION MEASURING INSTRUMENT
摘要 PURPOSE:To obtain time correlation in short time difference and spatial correlation between short distances with high resolution by providing an elementary particle-electron conversion surface, a deflector, a correlator, etc. CONSTITUTION:When a photon passes through an aperture and forms an image on the elementary particle-election conversion surface by an image forming lens system 50, an electron is emitted from the conversion surface 12 and incident on the deflector 15 through an acceleration electrode 13 and a converging electrode 14. Then the electron which is swept by the deflector 15 in a specific direction is multiplied by a electron multiplication part 16 and converted by a fluorescent screen 17 into light, which is inputted to a photodetector 19 through an output lens system 18 and picked up as a streak image. Then the correlator 20 performs the position arithmetic processing of respective bright points to perform correlative arithmetic processing. Thus, the time correlation in short time difference and spatial correlation between short distances are obtained with high resolution.
申请公布号 JPS6484121(A) 申请公布日期 1989.03.29
申请号 JP19870242225 申请日期 1987.09.27
申请人 HAMAMATSU PHOTONICS KK 发明人 URAGAMI TSUNEYUKI;TAKIGUCHI YOSHIHIRO;TSUCHIYA YUTAKA
分类号 G01T1/28;G01J1/02;G01T1/00;G01T3/00;G01T3/06 主分类号 G01T1/28
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