| 摘要 |
An installation for the dynamic burn-in testing of a plurality of digital circuits, and/or microcomputer-controlled circuits, mounted in a burn-in chamber for testing includes a personal computer; power supply for the digital circuits, and a bilateral line of communication between the PC computer and each of the digital circuits; the PC computer interrogating separately, and at will, any of the digital circuits as to their status and capability of changing status while retrieving any indication of a critical testing condition from any digital circuit, to determine a failure-free burn-in time.
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