发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 The device is for increasing the memory capacity. An electrode polysilicon (4) is superposed on a thin oxide film (2) separated by a thick oxide film (3) on a substrate (1) to form a capacitor. A silicon layer is superposed by recrystallization of polysilicon on a thick insulator layer (5) to form a MOSFET (7). Drain and polysilicon (4) are filled in a through-hole of the insulator (5) connected with the silicide (6) of high melting point metal, and bit wiring (8) for applying a signal to a source and aluminum word wiring (10) for applying a signal to an electrode (9) are provided.
申请公布号 KR890004461(B1) 申请公布日期 1989.11.04
申请号 KR19850002831 申请日期 1985.04.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 NISIMURA DADASI
分类号 G11C11/401;H01L21/8242;H01L21/84;H01L27/10;H01L27/108;H01L29/78;(IPC1-7):G11C11/00 主分类号 G11C11/401
代理机构 代理人
主权项
地址