发明名称 X-RAY EXPOSURE MASKS
摘要 An embodiment of the present invention provides an X-ray mask comprising an electrically conductive layer (9) translucent to X-ray and light beams, a gold layer (12) formed on the electrically conductive layer, of a thickness such as to be translucent to X-ray and light beams, for forming a plating base in combination with the electrically conductive layer, a stencil structure (101, 111), translucent to X-ray and light beams, formed on the electrically conductive layer to a mask pattern for forming a microscopic pattern on a semiconductor wafer, and a gold X-ray absorber (7), plated on the plating base (9, 12), in apertures in the stencil structure. Alignment of the X-ray mask to a semiconductor wafer can be precisely executed using a light beam passing through the stencil structure.
申请公布号 EP0231916(A3) 申请公布日期 1989.11.08
申请号 EP19870101361 申请日期 1987.02.02
申请人 FUJITSU LIMITED 发明人 NAKAGAWA, KENJI FUJITSU LTD.PAT.DEP.
分类号 G03F1/00;G03F1/22;G03F1/68;H01L21/027;H01L21/308 主分类号 G03F1/00
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