发明名称 FORMATION OF MULTILAYER WIRING INTERLAYER INSULATING FILM
摘要 PURPOSE:To restrain volatilization of solvent during application, to eliminate absorption of water, and to acquire high moisture resistance and high reliability without blister, bursting, etc., by using application solution using mixture solvent of high boiling point solvent. CONSTITUTION:Application solution which is mainly composed of Si(OC2H5)4 and whose solvent is made by mixing ethyl alcohol and ethyl at a specified mixing ratio is applied onto a substrate 1 which is provided with a plasma chemical vapor growth silicon nitride film 4 on an aluminum wirings 3a, 3b and a glass film 5 is formed. Thus formed flattened two layer aluminum wiring structure avoids any disconnection of aluminum wirings at an opening section 7. Furthermore, heat treatment at a later process ensures elimination of blister, bursting, etc., of an aluminum wiring of the opening section 7.
申请公布号 JPH02164097(A) 申请公布日期 1990.06.25
申请号 JP19880321247 申请日期 1988.12.19
申请人 NEC CORP 发明人 HONMA TETSUYA
分类号 H05K3/46;H01L21/316;H01L21/768;H01L23/522 主分类号 H05K3/46
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