发明名称 |
Badbit counter for memory testing |
摘要 |
Apparatus for comparing outputs of two digital devices and counting digital aberrations between them. One embodiment of this invention is the use of an XOR gate to compare the output of a DRAM under test to the output of a known good DRAM of corresponding operating characteristics, and the use of a counter to count the digital aberrations, known as badbits, between the two DRAMs.
|
申请公布号 |
US4942576(A) |
申请公布日期 |
1990.07.17 |
申请号 |
US19880261611 |
申请日期 |
1988.10.24 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
BUSACK, JON P.;JOHNSON, GARY M.;CLEM, RICHARD R. |
分类号 |
G01R31/3193;G06F11/00;G11C29/56 |
主分类号 |
G01R31/3193 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|