TESTING METHOD FOR SEMICONDUCTOR DEVICE,申请号JP19890024334-传众专利搜索

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发明名称	TESTING METHOD FOR SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH02203286(A)	申请公布日期	1990.08.13
申请号	JP19890024334	申请日期	1989.02.01
申请人	MITSUBISHI ELECTRIC CORP	发明人	ADACHI YUKINOBU
分类号	G01R31/26;G11C11/401;G11C11/408;G11C29/00;G11C29/56;H01L21/66;H01L21/822;H01L27/04;H01L27/10	主分类号	G01R31/26
代理机构		代理人
主权项
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