CONTACTING DEVICE FOR MEASURING SEMICONDUCTOR,申请号JP19890024898-传众专利搜索

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发明名称	CONTACTING DEVICE FOR MEASURING SEMICONDUCTOR
摘要
申请公布号	JPH02203278(A)	申请公布日期	1990.08.13
申请号	JP19890024898	申请日期	1989.02.02
申请人	NEC YAMAGATA LTD	发明人	SANADA KENICHI
分类号	G01R1/067	主分类号	G01R1/067
代理机构		代理人
主权项
地址

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